What is the LID and LeTID that would degrade the photovoltaic yield on Dualsun panels?

LID refers to the degradation of photovoltaic solar cells induced by prolonged exposure to strong solar radiation.

Less known and recognized than LID, LeTID (Light and elevated Temperature Induced Degradation) is a form of degradation of photovoltaic solar cells linked to combined and prolonged exposure to radiation and high temperatures.

The LID test described according to IEC 63202-1 standard applies to the photovoltaic cells and not to the panels. For the panels, there is the stabilization test.

Dualsun's solar panels are IEC 2016 certified. They have successfully passed the IEC 61215-1 tests which include the stabilization test (MQT 19).

During this test the panels are subjected to an irradiation of 1000W/m², their temperature must be 50°C +/-10°C, and are in MMPT operation.

Successive power measurements allow the evolution of the performance of the panels under these conditions to be monitored.

This test confirms that the performances of Dualsun panels stabilize very quickly once exposed to solar radiation. As an example during our certifications, a 300wp module initially flashed at 304.5wp stabilizes at 303.5wp.

To date there is no regulatory framework or standard covering LeTID. This is one of the reasons why 

As research on the characterization of this phenomenon advances and the standard of normative testing evolves, it will become possible to better characterize the sensitivity of each panel to LeTID. 

However, even if this is not yet officially quantifiable, cooling Dualsun Spring panels with a heat exchanger should have a positive impact on LeTID.